Jmp 14

JMP 14 Profilers covers the family of interactive profiling tools, which enable you to view cross-sections of any response surface. The book also includes details about plotting points and surfaces in a three-dimensional graph.

JMP 14 Quality and Process Methods describes tools for evaluating and improving processes. The book begins by discussing creating control charts, which let you visualize process measurements over time, quantify common cause variation, and identify special cause variation. Details about estimating your process capability based on measurement systems analysis studies are included. Lastly, the book discusses Pareto plots and cause-and-effect diagrams to identify root causes of variability.

JMP 14 Reliability and Survival Methods provides details about evaluating and improving reliability in a product or system and analyzing survival data for people and products. The book explains how to fit the best distribution to your time-to-event data or analyze destruction data. A few other topics include analyzing competing causes of failure, modeling reliability as improvements are made over time, and analyzing recurring events.

JMP 14 Multivariate Methods describes techniques for analyzing several variables simultaneously. The book covers descriptive measures, such as correlations. It also describes methods that give insight into the structure of the multivariate data, such as clustering, latent class analysis, principal components, discriminant analysis, and partial least squares.

JMP 14 Fitting Linear Models focuses on the Fit Model platform and many of its personalities. Linear and logistic regression, analysis of variance and covariance, and stepwise procedures are covered. Also included are multivariate analysis of variance, mixed models, generalized models, and models based on penalized regression techniques.